Published August 2003
| Published
Journal Article
Open
Low Voltage FESEM of Geological Materials
- Creators
-
Ma, Chi
-
Rossman, George R.
Chicago
An error occurred while generating the citation.
Abstract
Low voltage FESEM (i.e., operated at several hundred volts to 5 kV) which offers advantages in surface imaging due to reduced beam penetration, was found to be particularly useful in the investigation of uncoated, fine geological materials down to nano-scale. Here are three examples to highlight projects being conducted in our FESEM facility.
Additional Information
© 2003 Microscopy Society of America. Published online: 24 July 2003. Extended abstract of a paper presented at Microscopy and Microanalysis 2003 in San Antonio, Texas, USA, August 3–7, 2003. The Caltech Geology FESEM facility is supported in part by the MRSEC Program of the NSF under DMR-0080065. The projects are funded by the White Rose Foundation and the NSF.Attached Files
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Additional details
- Eprint ID
- 38222
- Resolver ID
- CaltechAUTHORS:20130502-074541444
- NSF MRSEC Program
- DMR-0080065
- White Rose Foundation
- NSF
- Created
-
2013-05-06Created from EPrint's datestamp field
- Updated
-
2021-11-09Created from EPrint's last_modified field
- Caltech groups
- Division of Geological and Planetary Sciences (GPS)