Published January 2006
| public
Journal Article
Low Voltage FESEM of Geological Materials
- Creators
-
Ma, Chi
-
Rossman, George R.
Abstract
Low voltage field emission SEM (i.e., operated at several hundred volts to 5 kV), offering advantages in surface imaging due to reduced beam penetration, was found to be particularly useful in the investigation of uncoated, fine, geological materials down to the nano-scale. Here are four examples to highlight projects being conducted in our FESEM facility.
Additional Information
© 2006 Microscopy Society of America. The Caltech Geology FESEM facility is supported in part by the MRSEC Program of the NSF under DMR-0080065. The projects are funded by the White Rose Foundation and the NSF.Additional details
- Eprint ID
- 38178
- Resolver ID
- CaltechAUTHORS:20130430-100136607
- DMR-0080065
- NSF MRSEC Program
- White Rose Foundation
- NSF
- Created
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2013-05-01Created from EPrint's datestamp field
- Updated
-
2020-03-09Created from EPrint's last_modified field
- Caltech groups
- Division of Geological and Planetary Sciences