Published August 18, 1997
| Submitted
Technical Report
Open
Improved Uniform Test Error Bounds
- Creators
- Bax, Eric
Chicago
An error occurred while generating the citation.
Abstract
We derive distribution-free uniform test error bounds that improve on VC-type bounds for validation. We show how to use knowledge of test inputs to improve the bounds. The bounds are sharp, but they require intense computation. We introduce a method to trade sharpness for speed of computation. Also, we compute the bounds for several test cases.
Additional Information
© 1997 California Institute of Technology. I thank Dr Joel Franklin for his teaching advice and encouragement I thank Zehra Cataltepe, Sam Roweis, and Joe Sill for their many helpful conversations and pointers to literature in the development of this work. Also thanks to Dr. Yaser Abu-Mostafa for his informative and inspiring teaching.Attached Files
Submitted - CSTR1997.pdf
Submitted - postscript.ps
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CSTR1997.pdf
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Additional details
- Eprint ID
- 26816
- Resolver ID
- CaltechCSTR:1997.cs-tr-97-15
- Created
-
2001-04-25Created from EPrint's datestamp field
- Updated
-
2019-10-03Created from EPrint's last_modified field
- Caltech groups
- Computer Science Technical Reports