Welcome to the new version of CaltechAUTHORS. Login is currently restricted to library staff. If you notice any issues, please email coda@library.caltech.edu
Published January 1, 1990 | public
Report Open

Testing Delay-Insensitive Circuits

Abstract

We show that a single stuck-at fault in a non-redundant delay-insensitive circuit results in a transition either not taking place or firing prematurely, or both, during an execution of the circuit. A transition not taking place can be tested easily, as this always prevents a transition on a primary output from taking place. A premature firing can also be tested but the addition of testing points may be required to enforce the premature firing and to propagate the transition to a primary output. Hence all single stuck-at faults are testable. All test sequences can be generated from the high-level specification of the circuit. The circuits are hazard-free in normal operation and during the tests.

Files

postscript.pdf
Files (1.8 MB)
Name Size Download all
md5:69b459abe5e68a47ff5caec912c72bc3
969.3 kB Download
md5:3ee6c51984a6a48c6441e9087cbbd70f
797.2 kB Preview Download

Additional details

Created:
August 19, 2023
Modified:
December 22, 2023