Published January 1, 1983
| public
Technical Report
Open
Techniques for Testing Integrated Circuits
- Creators
- DeBenedictis, Erik P.
Chicago
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Abstract
Abstract to be added.
Files
TR_4777_82.pdf
Files
(14.7 MB)
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Additional details
- Eprint ID
- 27059
- Resolver ID
- CaltechCSTR:1982.4777-tr-82
- Created
-
2003-01-02Created from EPrint's datestamp field
- Updated
-
2019-10-03Created from EPrint's last_modified field
- Caltech groups
- Computer Science Technical Reports