Published May 1, 2008
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An Apparatus for the Combined Measurement of Seebeck Coefficient and Electrical Resistivity
Abstract
An apparatus has been designed which allows simultaneous measurements of Seebeck coefficient and electrical resistivity of semiconducting thermoelectric materials from room temperature to 1300K.
Additional Information
The work described in this paper was carried out by the Jet Propulsion Laboratory, California Institute of Technology, under contract with the National Aeronautics and Space Administration.Files
JPLcombinedSeebeckResICT90.pdf
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- Eprint ID
- 10347
- Resolver ID
- CaltechAUTHORS:ZOLict90
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2008-05-01Created from EPrint's datestamp field
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2019-10-03Created from EPrint's last_modified field