Ion cyclotron resonance studies of radiative and dissociative electron attachment processes at low pressures

Abstract

Ion cyclotron resonance spectroscopy is used to measure nondissociative electron attachment rate constants for C6F6 (perfluorobenzene), C7F8 (perfluorotoluene), c-C4F8 (perfluorocyclobutane), and C7F14 (perfluoromethylcyclohexane) at low pressure (<10−6 Torr). Infrared emission is assumed to stabilize excited species leading to long-lived molecular negative ions. Combining the present data with negative ion lifetimes measured at low pressures by time-of-flight methods and electron attachment rates measured at high pressures in swarm experiments allows estimates of radiative lifetimes to be made. These all fall in the range from 0.4 to 1.5 msec, which are typical of infrared radiative lifetimes. Data are also presented for dissociative electron attachment to CCl4, where the rate limiting step is shown to be thermalization of the electron energy distribution. A number of different buffer gases are examined and the ion cyclotron resonance results extrapolate to yield the attachment rate measured in high pressure swarm experiments.

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