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Published June 1, 1986 | Submitted + Published
Journal Article Open

Dynamical x-ray diffraction from nonuniform crystalline films: Application to x-ray rocking curve analysis

Abstract

A dynamical model for the general case of Bragg x-ray diffraction from arbitrarily thick nonuniform crystalline films is presented. The model incorporates depth-dependent strain and a spherically symmetric Gaussian distribution of randomly displaced atoms and can be applied to the rocking curve analysis of ion-damaged single crystals and strained layer superlattices. The analysis of x-ray rocking curves using this model provides detailed strain and damage depth distributions for ion-implanted or MeV-ion-bombarded crystals and layer thickness, and lattice strain distributions for epitaxial layers and superlattices. The computation time using the dynamical model is comparable to that using a kinematical model. We also present detailed strain and damage depth distributions in MeV-ion-bombarded GaAs(100) crystals. The perpendicular strain at the sample surface, measured as a function of ion-beam dose (D), nuclear stopping power (Sn), and electronic stopping power (Se) is shown to vary according to (1–kSe)DSn and saturate at high doses.

Additional Information

© 1986 American Institute of Physics Received 9 September 1985; accepted 16 January 1986. This work was supported in part by the National Science Foundation (contract no. DMR 83-18274).

Errata

Erratum: Dynamical x-ray diffraction from nonuniform crystalline films: Application to x-ray rocking curve analysis [J. Appl. Phys. 59, 3743 (1986)]. C. R. Wie et al. J. Appl. Phys. 70, 2481 (1991)

Attached Files

Published - WIEjap86.pdf

Submitted - Dynamical_X-Ray_Diffraction_From_nonuniform_Crystalline-1985.pdf

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