Published June 20, 1994
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X-ray photoelectron spectroscopy measurement of valence-band offsets for Mg-based semiconductor compounds
Abstract
We have used x-ray photoelectron spectroscopy to measure the valence-band offsets for the lattice matched MgSe/Cd0.54Zn0.46Se and MgTe/Cd0.88Zn0.12Te heterojunctions grown by molecular beam epitaxy. By measuring core level to valence-band maxima and core level to core level binding energy separations, we obtain values of 0.56+/-0.07 eV and 0.43+/-0.11 eV for the valence-band offsets of MgSe/Cd0.54Zn0.46Se and MgTe/Cd0.88Zn0.12Te, respectively. Both of these values deviate from the common anion rule, as may be expected given the unoccupied cation d orbitals in Mg. Application of our results to the design of current II-VI wide band-gap light emitters is discussed.
Additional Information
Copyright © 1994 American Institute of Physics. Received 28 February 1994; accepted 8 April 1994. This work was supported by the Advanced Research Projects Agency monitored under ONR Contract No. N00014-92-J-1845.Files
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