Published September 8, 2008
| Supplemental Material + Published
Journal Article
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Nanopencil as a wear-tolerant probe for ultrahigh density data storage
Chicago
Abstract
A dielectric-sheathed carbon nanotube probe, resembling a "nanopencil," has been fabricated by conformal deposition of silicon-oxide on a carbon nanotube and subsequent "sharpening" to expose its tip. The high aspect-ratio nanopencil probe takes advantage of the small nanotube electrode size, while avoiding bending and buckling issues encountered with naked or polymer-coated carbon nanotube probes. Since the effective electrode diameter of the probe would not change even after significant wear, it is capable of long-lasting read/write operations in contact mode with a bit size of several nanometers.
Additional Information
© 2008 American Institute of Physics. Received 17 July 2008; accepted 19 August 2008; published 11 September 2008.Attached Files
Published - TAYapl08.pdf
Supplemental Material - 033837APL-methods.doc
Supplemental Material - README.TXT
Files
README.TXT
Additional details
- Eprint ID
- 11626
- Resolver ID
- CaltechAUTHORS:TAYapl08
- Created
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2008-09-14Created from EPrint's datestamp field
- Updated
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2021-11-08Created from EPrint's last_modified field