Published July 1999
| Published
Journal Article
Open
Failures in power-combining arrays
Chicago
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Abstract
We derive a simple formula for the change in output when a device fails in a power-combining structure with identical matched devices. The loss is written in terms of the scattering coefficient of the failed device and reflection coefficient of an input port in the combining network. We apply this formula to several power combiners, including arrays in free space and enclosed waveguide structures. Our simulations indicate the output power degrades gracefully as devices fail, which is in agreement with previously published results.
Additional Information
© 1999 IEEE. Reprinted with permission. Manuscript received September 22, 1998. This work was supported by the U.S. Air Force Material Command/Rome Laboratory and by the Army Research Office under a Multidisciplinary University Research Initiative Grant to Caltech.Attached Files
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- Eprint ID
- 1956
- Resolver ID
- CaltechAUTHORS:RUTieeetmtt99
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2006-02-25Created from EPrint's datestamp field
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2021-11-08Created from EPrint's last_modified field