Imaging mechanisms of force detected FMR microscopy
Abstract
We demonstrate spatial resolution of ferromagnetic resonance in a microscopic sample of YIG using ferromagnetic resonance force microscopy (FMRFM). Measurements were performed on a small single crystal YIG film grown on a GGG substrate, roughly rectangular in shape 20 µm×~150 µm and 3 µm thick. The perpendicular and parallel force geometries of FMRFM, in conjunction with an external bias field both parallel and perpendicular to the film, were used to scan the sample. This enabled the detection of strong signals, even at atmospheric pressure and room temperature. The fundamental and higher-order magnetostatic modes were observed to have 26–29 Gauss separation. The intensity of these modes exhibited spatial variation as the magnetic tip was scanned over the sample, and this behavior is qualitatively explained by DE theory. An improved fabrication method for magnet on cantilever was employed, which yielded a spatial resolution of 15 µm. These results demonstrate the potential of FMRFM for investigating the spatial dependence of ferromagnetic resonance, and for studying the anisotropy fields and exchange coupling effects within multilayer films and small magnetic systems.
Additional Information
© 2000 American Institute of Physics. We gratefully acknowledge funding for this work from the U.S. Department of Energy, Office of Basic Energy Services.Attached Files
Published - MIDjap00.pdf
Files
Name | Size | Download all |
---|---|---|
md5:313d22e9ff24a9454f7ebd47c9161d9a
|
152.3 kB | Preview Download |
Additional details
- Eprint ID
- 3390
- Resolver ID
- CaltechAUTHORS:MIDjap00
- Department of Energy (DOE)
- Created
-
2006-06-05Created from EPrint's datestamp field
- Updated
-
2021-11-08Created from EPrint's last_modified field