Published November 23, 1987
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Journal Article
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Maximum thickness of amorphous NiZr interlayers formed by a solid-state reaction technique
- Creators
- Meng, W. J.
- Nieh, C. W.
- Johnson, W. L.
Abstract
Formation of the equilibrium intermetallic compound NiZr in sputter deposited Ni/Zr diffusion couples is suppressed by the formation of a metastable amorphous NiZr alloy until a critical thickness of the amorphous NiZr interlayer is reached. The temperature dependence of this critical thickness is studied experimentally. A phenomenological model based on the premise of interfacial heterogeneous nucleation is proposed to understand the evolution of Ni/Zr diffusion couples.
Additional Information
© 1987 American Institute of Physics. Received 16 July 1987; accepted 28 September 1987. Technical assistance by C. Garland and C. Ahn is gratefully acknowledged. This work was supported by the U.S. Department of Energy, through contract No. DE-FG03-86ER45242. We thank E.J. Cotts and K. Samwer for helpful discussions.Files
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- CaltechAUTHORS:MENapl87b
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