Published January 30, 1989
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Journal Article
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Ion mixing of metal/Al bilayers near 77 K
- Creators
- Ma, E.
- Workman, T. W.
- Johnson, W. L.
- Nicolet, M-A.
Chicago
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Abstract
The efficiency of interfacial ion mixing is measured for metal/Al (metal=Ti, Cr, Ni, and Mo) thin-film bilayers irradiated with 285 keV Xe + ions near 77 K. The results indicate that, as a group, mixing of 3d-metal/Al pairs irradiated by Xe can be explained by neither a pure binary collision cascade nor a pure thermal spike model. Such a situation should exist; that it should be found at the average atomic numbers of the present bilayers is consistent with recent theoretical predictions.
Additional Information
Copyright © 1989 American Institute of Physics. Received 19 September 1988; accepted 20 November 1988. The authors thank Dr. R. S. Averback and Dr. Y.-T. Cheng for useful comments and discussions. This work was supported in part by National Science Foundation-Materials Research Group-DMR-8811795.Files
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- 4149
- Resolver ID
- CaltechAUTHORS:MAEapl89
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