Published January 15, 1985
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Low-temperature ion beam mixing of Pt and Si markers in Ge
Chicago
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Abstract
The mixing of Pt and Si marker atoms in Ge during 750-keV Xe irradiation was measured at temperatures between 6 and 500 K. The low-temperature measurements show that the mixing parameter for Pt is nearly twice that for Si. This result is in strong contradiction to the collisional theory of ion beam mixing. A weak temperature dependence in the mixing is found for both markers.
Additional Information
Copyright © 1985 American Institute of Physics (Received 26 March 1984; accepted 24 October 1984) This work was supported by the U.S. Department of Energy.Files
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