Published January 1988
| Published
Journal Article
Open
The reliability of single-error protected computer memories
- Creators
- Blaum, Mario
- Goodman, Rodney
- McEliece, Robert
Chicago
An error occurred while generating the citation.
Abstract
The lifetimes of computer memories which are protected with single-error-correcting-double-error-detecting (SEC-DED) codes are studies. The authors assume that there are five possible types of memory chip failure (single-cell, row, column, row-column and whole chip), and, after making a simplifying assumption (the Poisson assumption), have substantiated that experimentally. A simple closed-form expression is derived for the system reliability function. Using this formula and chip reliability data taken from published tables, it is possible to compute the mean time to failure for realistic memory systems.
Additional Information
© 1988 IEEE. Reprinted with permission. Manuscript received June 5, 1984; revised June 10, 1985. R. Goodman was supported by Caltech's Program in Advanced Technologies, sponsored by Aerojet General, General Motors, GTE, and TRW. R. McEliece was supported by a grant from IBM.Attached Files
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Additional details
- Eprint ID
- 11263
- Resolver ID
- CaltechAUTHORS:BLAieeetc88
- Caltech's Program in Advanced Technologies
- Aerojet General
- General Motors
- GTE
- TRW
- IBM
- Created
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2008-07-28Created from EPrint's datestamp field
- Updated
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2021-11-08Created from EPrint's last_modified field