Tilt illumination for structured illumination imaging

Creators: Jin, Xin; Ding, Xuemei; Tan, Jiubin; Shen, Cheng; Zhou, Xuyang; Liu, Shutian; Liu, Zhengjun

Abstract

To achieve super-resolution imaging, the information in higher frequency of the observed sample is collected by illuminating with a structure beam for a limited optical transfer function. In this paper, tilt illumination mode is introduced to structured illumination microscopy (SIM) for enhancing lateral resolution. More sample spectrum more than traditional SIM, can be obtained by detector. Thus, SIM with tilt illumination can be improved at the aspect of lateral imaging resolution.

Additional Information

© The Author(s), under exclusive licence to Springer Science+Business Media, LLC, part of Springer Nature 2021. Received 28 January 2021; Accepted 02 August 2021; Published 14 August 2021. This work was supported by the National Natural Science Foundation of China (Nos. 11874132, 61975044, and 12074094). The authors are indebted to reviewers for helpful comments and suggestions. The authors declare that they have no conflict of interest.

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Resource type: Journal Article
Publisher: Springer
Published in: Optical and Quantum Electronics, 53(9), Art. No. 516, ISSN: 0306-8919.

Created:: August 22, 2023
Modified:: October 23, 2023