Mueller matrix maps of dichroic filters reveal polarization aberrations
Abstract
Dichroic filters are used by instrument designers to split a field of view into different optical paths for simultaneous measurement of different spectral bands. Quantifying the polarization aberrations of a dichroic is relevant for predicting the incident polarization states downstream, which could affect the performance of diffraction limited systems. One important application is the fore-optics of exoplanet imaging coronagraphs. In this work, the polarization properties of the Edmund #69-205 650 nm roll-off dichroic are measured using a rotating retarder Mueller matrix imaging polarimeter. The polarization properties of this commercial dichroic are compared at normal and 45° angle of incidence. The normal incidence measurements verify the instrument calibration since no polarization aberrations were observed. Transmission measurements at 680 nm and 45° yield a 2.9 rad magnitude of retardance and 0.95 diattenuation. Effectively, at 630 nm the dichroic is a λ/4 waveplate with a horizontal fast-axis.
Additional Information
© 2020 Society of Photo-Optical Instrumentation Engineers (SPIE).Attached Files
Published - SPIE-AS20-249ec973-c4bc-ea11-8144-005056be78dc.pdf
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Additional details
- Eprint ID
- 107475
- Resolver ID
- CaltechAUTHORS:20210114-125019435
- Created
-
2021-01-14Created from EPrint's datestamp field
- Updated
-
2021-11-16Created from EPrint's last_modified field
- Series Name
- Proceedings of SPIE
- Series Volume or Issue Number
- 11443