Resistance of multilayers with long length scale interfacial roughness
- Creators
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Alicea, Jason
- Hershfield, Selman
Abstract
The resistance of multilayers with interfacial roughness on a length scale large compared to the layer spacing is obtained using the Boltzmann equation. Both the current-perpendicular-to-plane (CPP) and current-in-plane (CIP) geometries are considered in the limits where the mean-free paths are short and long compared to the atomic spacing. In the short mean-free path limit, the resistance decreases in the CPP geometry and increases in the CIP geometry. In the long mean-free path limit, the resistance increases in both configurations due to enhanced surface scattering. The giant magnetoresistance can either be enhanced or reduced by roughness depending on the sample parameters. Estimates of the short and long mean-free path effects in Fe/Cr multilayers are obtained using experimentally determined parameters.
Additional Information
© 2003 American Institute of Physics. (Presented on 14 November 2002) The authors would like to thank Tat-Sang Choy, Jack Bass, and Ivan Schuller for helpful discussions. This research was supported by the DOD/AFOSR Grant No. F49620-96-1-0026, the Center for Condensed Matter Sciences, the University Scholars Program at the University of Florida, and the National Science Foundation through the U.F. Physics REU Program.Attached Files
Published - 1.1555799.pdf
Submitted - 0208251.pdf
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Additional details
- Eprint ID
- 101543
- Resolver ID
- CaltechAUTHORS:20200225-123359581
- F49620-96-1-0026
- Air Force Office of Scientific Research (AFOSR)
- University of Florida
- NSF
- Created
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2020-02-26Created from EPrint's datestamp field
- Updated
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2021-11-16Created from EPrint's last_modified field