Published January 8, 2016
| Published + Accepted Version
Journal Article
Open
Superconducting Detectors for Superlight Dark Matter
- Creators
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Hochberg, Yonit
- Zhao, Yue
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Zurek, Kathryn M.
Abstract
We propose and study a new class of superconducting detectors that are sensitive to O(meV) electron recoils from dark matter–electron scattering. Such devices could detect dark matter as light as the warm dark-matter limit, m_X≳1 keV. We compute the rate of dark-matter scattering off of free electrons in a (superconducting) metal, including the relevant Pauli blocking factors. We demonstrate that classes of dark matter consistent with terrestrial and cosmological or astrophysical constraints could be detected by such detectors with a moderate size exposure.
Additional Information
© 2016 American Physical Society. (Received 8 June 2015; revised manuscript received 21 October 2015; published 7 January 2016) We thank Ehud Altman, Snir Gazit, Roni Ilan, Dave Moore, Joel Moore, and Zohar Ringel for useful discussions, and Jeremy Mardon for helpful correspondence and comments on the manuscript. We are especially grateful to John Clarke and Matt Pyle for critical conversations on viable detector designs. The work of Y. H. is supported by the U.S. National Science Foundation under Grant No. PHY-1002399. Y. H. is an awardee of the Weizmann Institute of Science—National Postdoctoral Award Program for Advancing Women in Science. Y. Z. is supported by ERC Grant BSMOXFORD No. 228169. K. M. Z. is supported by the Department of Energy under Contract No. DE-AC02-05CH11231.Attached Files
Published - PhysRevLett.116.011301.pdf
Accepted Version - 1504.07237.pdf
Files
1504.07237.pdf
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Additional details
- Alternative title
- Superconducting Detectors for Super Light Dark Matter
- Eprint ID
- 96418
- Resolver ID
- CaltechAUTHORS:20190613-164149405
- PHY-1002399
- NSF
- Weizmann Institute of Science
- 228169
- European Research Council (ERC)
- DE-AC02-05CH11231
- Department of Energy (DOE)
- Created
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2019-06-17Created from EPrint's datestamp field
- Updated
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2021-11-16Created from EPrint's last_modified field