Published January 29, 2019
| Submitted
Discussion Paper
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Apparatus to Measure Optical Scatter of Coatings Versus Annealing Temperature
Chicago
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Abstract
Light scattered by amorphous thin-film optical coatings limits the sensitivity of interferometric gravitational-wave detectors. We describe an imaging scatterometer to assess the role that crystal growth during annealing plays in this scatter.
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Additional details
- Eprint ID
- 94591
- Resolver ID
- CaltechAUTHORS:20190409-124545596
- Created
-
2019-04-09Created from EPrint's datestamp field
- Updated
-
2023-06-02Created from EPrint's last_modified field
- Caltech groups
- LIGO
- Other Numbering System Name
- LIGO Document
- Other Numbering System Identifier
- P1700151