Welcome to the new version of CaltechAUTHORS. Login is currently restricted to library staff. If you notice any issues, please email coda@library.caltech.edu
Published April 9, 2019 | Submitted
Report Open

Apparatus to Measure Optical Scatter of Coatings Versus Annealing Temperature

Abstract

Light scattered by amorphous thin-film optical coatings limits the sensitivity of interferometric gravitational-wave detectors. We describe an imaging scatterometer to assess the role that crystal growth during annealing plays in this scatter.

Attached Files

Submitted - 1901.11400.pdf

Files

1901.11400.pdf
Files (613.6 kB)
Name Size Download all
md5:1cd8ec4602181334dd8f39053fabb055
613.6 kB Preview Download

Additional details

Created:
August 19, 2023
Modified:
October 20, 2023