Published September 1988
| Published
Journal Article
Open
Linear sum codes for random access memories
- Creators
- Fuja, Tom
- Heegard, Chris
- Goodman, Rod
Chicago
Abstract
Linear sum codes (LSCs) form a class of error control codes designed to provide on-chip error correction to semiconductor random access memories (RAMs). They use the natural addressing scheme found on RAMs to form and access codewords with a minimum of overhead. The authors formally define linear sum codes and examine some of their characteristics. Specifically, they examine their minimum distance characteristics, their error correcting capabilities, and the complexity involved in their implementation. In addition, detailed consideration is given to an easily implemented class of single-, double-, and triple-error correcting LSCs.
Additional Information
© 1988 IEEE. Manuscript received May 14, 1986; revised March 30, 1987 and August 14, 1987. This work was supported by NATO Grant 215/84, NSF Grant ECS-8352220, by a grant from AT&T Information Systems, by the AT&T Bell Laboratories Ph.D. Scholarship Program, and by Caltech's Program in Advanced Technologies sponsored by Aerojet General, General Motors, GTE, and TRW. This work was presented in part at the International Symposium on Information Theory, Brighton, England, June 23-28, 1985, and at the Allerton Conference on Communications, Control, and Computing, The University of Illinois, October 2-4, 1985.Attached Files
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Additional details
- Eprint ID
- 93820
- Resolver ID
- CaltechAUTHORS:20190314-130609423
- North Atlantic Treaty Organization (NATO)
- 215/84
- NSF
- ECS-8352220
- AT&T
- Caltech's Program in Advanced Technologies
- Aerojet General
- General Motors
- GTE
- TRW
- Created
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2019-03-14Created from EPrint's datestamp field
- Updated
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2021-11-16Created from EPrint's last_modified field