Published February 26, 2003
| Published
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Dependence of the micro-arcsecond metrology (MAM) testbed performance prediction on white light algorithm approach
- Other:
- Shao, Michael
Chicago
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Abstract
MAM is a dedicated systems-level testbed that combines the major SIM subsystems including laser metrogy, pointing, and pathlength control. The testbed is configured as a modified Michelson interferometer for the purpose of studying the white-light fringe measurement processes. This paper will compare the performance of various algorithms using the MAM data, and will aid in our recommendation of how the SIM flight system should process the science and guide interferometer data.
Additional Information
© 2003 Society of Photo-Optical Instrumentation Engineers (SPIE). The research described was performed at the Jet Propulsion Laboratory, California Institute of Technology, under a contract with the National Aeronautics and Space Administration. Special thanks to Rich Machuzak for his skilled, tireless, and ever-cheerful operation of the MAM experiments. Thanks to Renaud Goullioud, Feng Zhao, Jeff Yu and Mike Shao for conversations providing helpful insight. Thanks to the entire team of people at JPL who have helped with MAM, and to our partners at Lockheed Martin for their contributions to MAM.Attached Files
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Additional details
- Eprint ID
- 93033
- Resolver ID
- CaltechAUTHORS:20190221-110515868
- NASA/JPL/Caltech
- Created
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2019-03-05Created from EPrint's datestamp field
- Updated
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2021-11-16Created from EPrint's last_modified field
- Caltech groups
- Infrared Processing and Analysis Center (IPAC)
- Series Name
- Proceedings of SPIE
- Series Volume or Issue Number
- 4852