Published April 27, 2011
| public
Journal Article
Measuring Graphene Piezoreisistance via In-Situ Nanoindentation
- Creators
- Huang, M.
-
Greer, J. R.
Chicago
Abstract
We report piezoresistance measurements of uniaxially strained graphene ribbons obtained by performing in-situ nanoindentation experiments on suspended graphene devices with simultaneous electrical measurements. We find the Young's modulus of graphene to be ~335 N/m, which is consistent with previous reports. We measure the gauge factor of graphene ribbons to be ~2, a value close to that predicted by a tight binding model.
Additional Information
© 2011 ECS - The Electrochemical Society.Additional details
- Eprint ID
- 89644
- DOI
- 10.1149/1.3569914
- Resolver ID
- CaltechAUTHORS:20180914-101019654
- Created
-
2018-09-14Created from EPrint's datestamp field
- Updated
-
2021-11-16Created from EPrint's last_modified field