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Published July 10, 2003 | Published
Book Section - Chapter Open

New implementation of second harmonic generation microscopy for three-dimensional resolution

Abstract

We present a fast scanning transmission-mode confocal scanning laser microscope system based on the use of a second harmonic generation (SHG) crystal for signal detection. The quadratic intensity dependence of SHG is exploited to preferentially reveal unscattered signal light and reject out-of-focus scattered background. The SHG crystal plays the role of a virtual pinhole that remains self-aligned without a need for de-scanning. We demonstrate that this new microscope method produces images with higher contrast and less speckle than transmission scanning microscopy with linear detection.

Additional Information

© 2003 Society of Photo-Optical Instrumentation Engineers (SPIE). We thank L. Moreaux for initial work on this project. C. Y. is grateful to INSERM (France) and ASTAR (Singapore) for financial support and fellowship award.

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