Published March 15, 2018
| public
Book Section - Chapter
Fourier ptychography for parallel microscopy
- Creators
-
Yang, Changhuei
- Others:
- Tsia, Kevin K.
- Goda, Keisuke
Chicago
An error occurred while generating the citation.
Abstract
Fourier Ptychography has shown that we can computationally correct physical aberrations. Thereby, allow us to move beyond the traditional strategy of accomplishing high quality imaging through the exacting refinement of the physical microscope system. I will report on the use of Fourier Ptychography to implement high quality parallel imaging with plastic molded lenses for 96 well plate imaging.
Additional Information
© 2018 Society of Photo-optical Instrumentation Engineers (SPIE).Additional details
- Eprint ID
- 87908
- Resolver ID
- CaltechAUTHORS:20180717-081043968
- Created
-
2018-07-17Created from EPrint's datestamp field
- Updated
-
2021-11-16Created from EPrint's last_modified field
- Series Name
- Proceedings of SPIE
- Series Volume or Issue Number
- 10505