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Published May 23, 2001 | Published
Book Section - Chapter Open

Interferometric phase-based dual-wavelength tomography

Abstract

We describe our phase-sensitive interferometry technique implemented as phase dispersion microscopy (PDM)/optical tomography (PDOT). The technique is based on measuring the phase difference between fundamental and second harmonic low coherence light in a novel interferometer. We attain high sensitivity to subtle refractive index differences due to dispersion with a differential optical path sensitivity of 5 nm. Using PDM, we show that ballistic light in a turbid medium undergoes a phase velocity change that is dependent on scatterer size. We demonstrate that the microscopy technique performs better than a conventional phase contrast microscope in imaging dispersive and weakly scattering samples. The tomographic implementation of the technique (PDOT) can complement Optical Coherence Tomography (OCT) by providing phase information about the scanned object.

Additional Information

© 2001 Society of Photo-Optical Instrumentation Engineers (SPIE). W ewould like to acknowledge the assistance of Irene Georgakoudi, Eugene B. Hanlon and Kamran Badizadegan with sample preparation and analysis. This work was carried out at the MIT Laser Biomedical Research Center and was supported by NIH grant P41-RR02594, NSF grant 9708265-CHE and a grant from Hamamatsu Corporation. Adam Wax is supported by NIH National Research Service Award 1 F32 RR05075-01.

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