Quantum dot photonic crystal detectors
Abstract
In this paper we report the use of a photonic crystal resonant cavity to increase the quantum efficiency, detectivity (D*) and the background limited infrared photodetector (BLIP) temperature of a quantum dot detector. The photonic crystal is incorporated in InAs/InGaAs/GaAs dots-in-well (DWELL) detector using Electron beam lithography. From calibrated blackbody measurements, the conversion efficiency of the detector with the photonic crystal (DWELL-PC) is found to be 58.5% at -2.5 V while the control DWELL detectors have quantum efficiency of 7.6% at the same bias. We observed no significant reduction in the dark current of the photonic crystal devices compared to the normal structure. The generation-recombination limited D* at 77K with a 300K F1.7 background, is estimated to be 6 x 10^(10) cm Hz^(1/2)/W at -3V bias for the DWELL-PC which is a factor of 20 higher than that of the control sample. We also observed a 20% increase in the BLIP temperature for the DWELL-PCs.
Additional Information
© 2006 Society of Photo-Optical Instrumentation Engineers (SPIE). The authors would like to acknowledge support from NSF ECS Grants 0428756/ 0401154/0434102.Attached Files
In Press - 612906.pdf
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Additional details
- Eprint ID
- 87674
- Resolver ID
- CaltechAUTHORS:20180709-163430790
- NSF
- ECS-0428756
- NSF
- ECS-0401154
- NSF
- ECS-0434102
- Created
-
2018-07-10Created from EPrint's datestamp field
- Updated
-
2021-11-15Created from EPrint's last_modified field
- Series Name
- Proceedings of SPIE
- Series Volume or Issue Number
- 6129