Published November 2000
| public
Journal Article
Reactively sputtered ternary films of the type TM–Si–N and their properties (TM=early transition metal)
- Creators
- Nicolet, Marc-A.
Chicago
Abstract
After a brief historical introduction, the two main techniques used so far to synthesize TM–Si–N films are mentioned. Although principally developed and investigated for application to semiconductor devices, unanticipated alternative uses of TM–Si–N films have arisen. The most fully investigated alloy of the group is Ti–Si–N. Its known properties are reviewed. General trends are outlined that apply generally to all TM–Si–N alloys, with variations peculiar to each transition metal case. Other reactively sputtered ternary nitrogen compounds with related characteristics are also mentioned briefly, as well as the possibility to envisage analogous ternary alloys based on combinations of different elements.
Additional Information
© 2000 Elsevier Science Ltd. Available online 25 September 2000.Additional details
- Eprint ID
- 80522
- Resolver ID
- CaltechAUTHORS:20170816-155358775
- Created
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2017-08-16Created from EPrint's datestamp field
- Updated
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2021-11-15Created from EPrint's last_modified field