Published February 1974
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Charge transfer in buried-channel charge-coupled devices
Chicago
Abstract
A detailed numerical simulation of the charge-transfer process in buried-channel CCDs will be presented. The limitations on the device performance due to incomplete free charge transfer, device parameters and clocking waveforms will be discussed.
Additional Information
© 1974 IEEE. Supported in part by the Naval Research Laboratories under contract No. N00014-67-A-0094-0032.Attached Files
Published - 01155317.pdf
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Additional details
- Eprint ID
- 80035
- Resolver ID
- CaltechAUTHORS:20170809-150823368
- Naval Research Laboratory
- N00014-67-A-0094-0032
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2017-08-09Created from EPrint's datestamp field
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2021-11-15Created from EPrint's last_modified field