Gas-phase Silicon Etching With Bromine Trifluoride
- Creators
- Wang, Xuan-Qi
- Yang, Xing
- Walsh, Ken
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Tai, Yu-Chong
Abstract
We report the first study of gas phase silicon micromachining using pure bromine trifluoride (BrF/sub 3/) gas at room temperature. This work includes both the design of a new apparatus and etching characterization. Consistent etching results and high molecular etching efficiency (80%) have been achieved by performing the etching in a controlled pulse mode. This pure gaseous BrF/sub 3/ etching process is isotropic and has a high etch rate with superb selectivity over silicon dioxide (3000:1), silicon nitride (400-800:1) and photoresist (1000:1). Moreover, gaseous BrF/sub 3/ etching has also been demonstrated in surface micromachining process, where silicon nitride channels and membranes using polysilicon as the sacrificial layer have been successfully fabricated.
Additional Information
© 1997 IEEE. The authors would like to thank Trevor Roper, Larry Begay for help with the system setup and Tomas Tsao, Charles Grosjean with helpful discussions.Attached Files
Published - 00635751.pdf
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Additional details
- Eprint ID
- 77777
- Resolver ID
- CaltechAUTHORS:20170525-161134683
- Created
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2017-05-26Created from EPrint's datestamp field
- Updated
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2021-11-15Created from EPrint's last_modified field