A search for evidence of strain gradient hardening in Au submicron pillars under uniaxial compression using synchrotron X-ray microdiffraction
Abstract
When crystalline materials are mechanically deformed in small volumes, higher stresses are needed for plastic flow. This has been called the "smaller is stronger" phenomenon and has been widely observed. Various size-dependent strengthening mechanisms have been proposed to account for such effects, often involving strain gradients. Here we report on a search for strain gradients as a possible source of strength for single-crystal submicron pillars of gold subjected to uniform compression, using a submicron white-beam (Laue) X-ray diffraction technique. We have found, both before and after uniaxial compression, no evidence of either significant lattice curvature or subgrain structure. This is true even after 35% strain and a high flow stress of 300 MPa were achieved during deformation. These observations suggest that plasticity here is not controlled by strain gradients or substructure hardening, but rather by dislocation source starvation, wherein smaller volumes are stronger because fewer sources of dislocations are available.
Additional Information
© 2007 Acta Materialia Inc. Published by Elsevier Ltd. Received 23 May 2007, Revised 12 October 2007, Accepted 13 October 2007, Available online 19 December 2007. This work was supported by the Office of Science, Office of Basic Energy Sciences, of the US Department of Energy under Contract Nos. DE-FG02-04ER46163 and DE-AC02-05CH11231. Additional support though an NSF-EU Collaborative Research Program: NANOMESO under NSF Grant No. 0502208 is gratefully acknowledged.Additional details
- Eprint ID
- 76002
- DOI
- 10.1016/j.actamat.2007.10.031
- Resolver ID
- CaltechAUTHORS:20170408-144528730
- Department of Energy (DOE)
- DE-FG02-04ER46163
- Department of Energy (DOE)
- DE-AC02-05CH11231
- NSF
- DMR-0502208
- Created
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2017-05-04Created from EPrint's datestamp field
- Updated
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2021-11-15Created from EPrint's last_modified field