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Published June 26, 2016 | Published
Book Section - Chapter Open

The Infrared Imaging Spectrograph (IRIS) for TMT: multi-tiered wavefront measurements and novel mechanical design

Abstract

The InfraRed Imaging Spectrograph (IRIS) will be the first light adaptive optics instrument on the Thirty Meter Telescope (TMT). IRIS is being built by a collaboration between Caltech, the University of California, NAOJ and NRC Herzberg. In this paper we present novel aspects of the Support Structure, Rotator and On-Instrument Wavefront Sensor systems being developed at NRC Herzberg. IRIS is suspended from the bottom port of the Narrow Field Infrared Adaptive Optics System (NFIRAOS), and provides its own image de-rotation to compensate for sidereal rotation of the focal plane. This arrangement is a challenge because NFIRAOS is designed to host two other science instruments, which imposes strict mass requirements on IRIS. As the mechanical design of all elements has progressed, we have been tasked with keeping the instrument mass under seven tonnes. This requirement has resulted in a mass reduction of 30 percent for the support structure and rotator compared to the most recent IRIS designs. To accomplish this goal, while still being able to withstand earthquakes, we developed a new design with composite materials. As IRIS is a client instrument of NFIRAOS, it benefits from NFIRAOS's superior AO correction. IRIS plays an important role in providing this correction by sensing low-order aberrations with three On-Instrument Wavefront Sensors (OIWFS). The OIWFS consists of three independently positioned natural guide star wavefront sensor probe arms that patrol a 2-arcminute field of view. We expect tip-tilt measurements from faint stars within the IRIS imager focal plane will further stabilize the delivered image quality. We describe how the use of On-Detector Guide Windows (ODGWs) in the IRIS imaging detector can be incorporated into the AO correction. In this paper, we present our strategies for acquiring and tracking sources with this complex AO system, and for mitigating and measuring the various potential sources of image blur and misalignment due to properties of the mechanical structure and interfaces.

Additional Information

© 2016 Society of Photo-Optical Instrumentation Engineers (SPIE).

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