Investigation of the Si/TiO_2/Electrolyte Interface Using Operando Tender X-ray Photoelectron Spectroscopy
Abstract
Semiconductor-electrolyte interfaces allow for the creation of photoactive semiconductor systems that have band bending and other characteristics analogous to semiconductor-metal junctions (Schottky junctions). We demonstrate herein that XPS measurements can be obtained on a full three-electrode electrochemical system under potentiostatic control by use of tender X-rays to provide photoelectrons with sufficient kinetic energy to penetrate through a thin electrolyte overlayer on a portion of the working electrode. The response of the photoelectron binding energies to variations in applied voltage demonstrates that the XPS investigation works in an operando manner to elucidate the energetics of such interfaces.
Additional Information
© 2015 ECS - The Electrochemical Society. This work was supported through the Office of Science of the U.S. Department of Energy (DOE) under award no. DE-SC0004993 to the Joint Center for Artificial Photosynthesis, a DOE Energy Innovation Hub. The Advanced Light Source is supported by the Director, Office of Science, Office of Basic Energy Sciences, of the U.S. Department of Energy under Contract No. DE-AC02-05CH11231. We thank Dr. Philip Ross for contributions to the conceptual development of the AP-XPS end-station and experimental design.Attached Files
Published - ECS_Trans.-2015-Lichterman-97-103.pdf
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Additional details
- Eprint ID
- 72185
- Resolver ID
- CaltechAUTHORS:20161121-082816017
- Department of Energy (DOE)
- DE-SC0004993
- Department of Energy (DOE)
- DE-AC02-05CH11231
- Created
-
2016-11-21Created from EPrint's datestamp field
- Updated
-
2021-11-11Created from EPrint's last_modified field
- Caltech groups
- JCAP, Kavli Nanoscience Institute