Welcome to the new version of CaltechAUTHORS. Login is currently restricted to library staff. If you notice any issues, please email coda@library.caltech.edu
Published November 30, 2016 | public
Journal Article

Optical and electrical properties of boron doped diamond thin conductive films deposited on fused silica glass substrates

Abstract

This paper presents boron-doped diamond (BDD) film as a conductive coating for optical and electronic purposes. Seeding and growth processes of thin diamond films on fused silica have been investigated. Growth processes of thin diamond films on fused silica were investigated at various boron doping level and methane admixture. Two step pre-treatment procedure of fused silica substrate was applied to achieve high seeding density. First, the substrates undergo the hydrogen plasma treatment then spin-coating seeding using a dispersion consisting of detonation nanodiamond in dimethyl sulfoxide with polyvinyl alcohol was applied. Such an approach results in seeding density of 2 × 10^(10) cm^(−2). The scanning electron microscopy images showed homogenous, continuous and polycrystalline surface morphology with minimal grain size of 200 nm for highly boron doped films. The sp^3/sp^2 ratio was calculated using Raman spectra deconvolution method. A high refractive index (range of 2.0–2.4 @550 nm) was achieved for BDD films deposited at 500 °C. The values of extinction coefficient were below 0.1 at λ = 550 nm, indicating low absorption of the film. The fabricated BDD thin films displayed resistivity below 48 Ohm cm and transmittance over 60% in the visible wavelength range.

Additional Information

© 2016 Elsevier B.V. Received 26 January 2016; Received in revised form 26 May 2016; Accepted 27 June 2016; Available online 29 June 2016. This work was supported by the Polish National Science Centre (NCN) under the Grants No. 2014/14/M/ST5/00715 and 2015/17/D/ST5/02571. The DS funds of Faculty of Electronics, Telecommunications and Informatics of the Gdansk University of Technology are also acknowledged. The authors acknowledge Alexander Tools (Gdynia, Poland) for their technical support. The AFM measurements were done at the Faculty of Microsystems Electronics and Photonics by the courtesy of Prof. Teodor Gotszalk. R. Bogdanowicz wants to thank Prof. W. A. Goddard for invitation and hosting in California Institute of Technology. The Fulbright Commission is acknowledged for financial support of this fellowship.

Additional details

Created:
August 19, 2023
Modified:
October 23, 2023