Published July 21, 2010
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ASTRA: astrometry and phase-referencing astronomy on the Keck interferometer
Chicago
Abstract
ASTRA (ASTrometric and phase-Referencing Astronomy) is an upgrade to the existing Keck Interferometer which aims at providing new self-phase referencing (high spectral resolution observation of YSOs), dual-field phase referencing (sensitive AGN observations), and astrometric (known exoplanetary systems characterization and galactic center general relativity in strong field regime) capabilities. With the first high spectral resolution mode now offered to the community, this contribution focuses on the progress of the dual field and astrometric modes.
Additional Information
© 2010 SPIE The International Society for Optical Engineering. The W. M. Keck Observatory is operated as a scientific partnership among the California Institute of Technology, the University of California, and the National Aeronautics and Space Administration. The Observatory was made possible by the generous financial support of the W. M. Keck Foundation. The authors wish to recognize and acknowledge the very significant cultural role and reverence that the summit of Mauna Kea has always had within the indigenous Hawaiian community. We are most fortunate to have the opportunity to conduct observations from this mountain. We would like to acknowledge the Keck Interferometer project funded by the National Aeronautics and Space Administration (NASA) and developed and operated by the Jet Propulsion Laboratory, the W. M. Keck Observatory and the NASA Exoplanet Science Institute. This material is based upon work supported by the National Science Foundation under Grant No. AST-0619965.Attached Files
Published - 773412_1.pdf
Submitted - 1208.3272v1.pdf
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Additional details
- Eprint ID
- 71657
- Resolver ID
- CaltechAUTHORS:20161101-102709293
- W. M. Keck Foundation
- NASA
- NSF
- AST-0619965
- Created
-
2016-11-01Created from EPrint's datestamp field
- Updated
-
2021-11-11Created from EPrint's last_modified field
- Caltech groups
- Infrared Processing and Analysis Center (IPAC)
- Series Name
- Proceedings of SPIE
- Series Volume or Issue Number
- 7734