Laser Spectroscopy Of Electronic Resonances: An Electro-Optic Technique For Probing Coherent And Incoherent Decay Processes
- Creators
- Zewail, A. H.
- Other:
- Weinberg, J. M.
Abstract
A new technique is presented for measuring the incoherent resonance decay (IRD) and the coherent optical ringing of selectively (5 MHz) prepared electronic states. The method utilizes electro-optic switching of a single laser mode that is on or off resonance with respect to the homogeneous molecular packets in the excited ensemble. The technique was applied to a variety of systems (gases at low pressures, gases at relatively high pressures, and solids at low temperatures) to give information about their phase memory (optical T2 processes), radiative and radiationless decay (optical T1 processes), and to measure directly their optical transition moment between the ground state and the prepared electronic state. The theory of coherent and incoherent states is also given.
Additional Information
© 1976 International Society for Optical Engineering. This work was supported in part by the Sloan Fund. I wish to thank Drs. J. Morris Weinberg and T. Hirschfeld for inviting me to present this work at the 20th Annual Symposium on Optical, Electro-optical, Laser and Photographic Technology (sponsored by the Society of Photo-Optical Instrumentation Engineers, SPIE) in August of 1976. I should point out that it was the work of T. E. Orlowski and D. R. Dawson of this laboratory which raised the issues discussed in this paper. I would also like to thank Kevin Jones for many hours of stimulating discussions.Attached Files
Published - 0082_43.pdf
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Additional details
- Eprint ID
- 70584
- Resolver ID
- CaltechAUTHORS:20160926-083201215
- Alfred P. Sloan Foundation
- Created
-
2016-09-28Created from EPrint's datestamp field
- Updated
-
2021-11-11Created from EPrint's last_modified field
- Series Name
- Proceedings of SPIE
- Series Volume or Issue Number
- 82
- Other Numbering System Name
- Arthur Amos Noyes Laboratory of Chemical Physics
- Other Numbering System Identifier
- 5427