Published May 10, 2004
| public
Journal Article
Ultrafast Electron Crystallography of Surface Structural Dynamics with Atomic-Scale Resolution
Abstract
A formidable contender to X-ray diffraction is ultrafast electron crystallography. Whereas the former is more suited to investigate the bulk of the substrate, the time, length, and sensitivity scales of electron crystallography provide powerful and complementary information on atomic-scale structural dynamics at the surface (see diffraction image of GaAs crystal).
Additional Information
© 2004 Wiley-VCH Verlag GmbH & Co. Received: February 10, 2004. Published Online: March 23, 2004. This work was supported by the National Science Foundation. Some support was also provided by the Air Force Office of Scientific Research. F.V. acknowledges partial financial support from the Swiss National Science Foundation and S.C. a Millikan fellowship at Caltech. We thank Professor N. Lewis and L. Webb for functionalizing the silicon surface.Additional details
- Eprint ID
- 69696
- DOI
- 10.1002/anie.200453983
- Resolver ID
- CaltechAUTHORS:20160817-092916920
- NSF
- Air Force Office of Scientific Research (AFOSR)
- Swiss National Science Foundation (SNSF)
- Robert A. Millikan Fellowship
- Created
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2016-08-17Created from EPrint's datestamp field
- Updated
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2021-11-11Created from EPrint's last_modified field