A titanium-nitride near-infrared kinetic inductance photon-counting detector and its anomalous electrodynamics

Creators: Gao, J.; Vissers, M. R.; Sandberg, M. O.; da Silva, F. C. S.; Nam, S. W.; Pappas, D. P.; Wisbey, D. S.; Langman, E. C.; Meeker, S. R.; Mazin, B. A.; Leduc, H. G.; Zmuidzinas, J.; Irwin, K. D.

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Abstract

We demonstrate single-photon counting at 1550 nm with titanium-nitride (TiN) microwave kinetic inductancedetectors. Full-width-at-half-maximum energy resolution of 0.4 eV is achieved. 0-, 1-, 2-photon events are resolved and shown to follow Poisson statistics. We find that the temperature-dependent frequency shift deviates from the Mattis-Bardeen theory, and the dissipation response shows a shorter decay time than the frequency response at low temperatures. We suggest that the observed anomalous electrodynamics may be related to quasiparticle traps or subgap states in the disordered TiN films. Finally, the electron density-of-states is derived from the pulse response.

Additional Information

© 2012 American Institute of Physics (Received 3 August 2012; accepted 17 September 2012; published online 5 October 2012) We thank T. Klapwijk, T. Norguchi, J. Martinis, G. O'Nell, and A. Lita for useful discussions. We acknowledge support for this work from the Keck Institute for Space Studies and NASA under Contract No. NNH11AR83I. The TiN film was deposited in the JPL Microdevices Lab (MDL), and the device was fabricated in the NIST cleanroom.

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