Published March 1962
| Published
Journal Article
Open
Pulse Characteristic Display for Tunnel Emission Devices
- Creators
-
Mead, C. A.
Chicago
Abstract
Recent studies on tunnel emission devices have demonstrated that destruction normally occurs because of high temperature generated within the thin film structure while their electrical characteristics are being measured. This difficulty has been overcome to a large degree by pulse tests performed with the unit described here. The most useful data to be observed on devices designed to emit electrons into a vacuum are: (a) the voltampere characteristic of the diode (metal-insulator-metal structure), and (b) the transfer characteristic (i.e., emitted current vs diode current).
Additional Information
© 1962 The American Institute of Physics. Received 08 December 1961.Attached Files
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- Eprint ID
- 60011
- Resolver ID
- CaltechAUTHORS:20150901-114712753
- Created
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2015-09-01Created from EPrint's datestamp field
- Updated
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2021-11-10Created from EPrint's last_modified field