Dense dislocation arrays embedded in grain boundaries for high-performance bulk thermoelectrics
Abstract
The widespread use of thermoelectric technology is constrained by a relatively low conversion efficiency of the bulk alloys, which is evaluated in terms of a dimensionless figure of merit (zT). The zT of bulk alloys can be improved by reducing lattice thermal conductivity through grain boundary and point-defect scattering, which target low- and high-frequency phonons. Dense dislocation arrays formed at low-energy grain boundaries by liquid-phase compaction in Bi_(0.5)Sb_(1.5)Te_3 (bismuth antimony telluride) effectively scatter midfrequency phonons, leading to a substantially lower lattice thermal conductivity. Full-spectrum phonon scattering with minimal charge-carrier scattering dramatically improved the zT to 1.86 ± 0.15 at 320 kelvin (K). Further, a thermoelectric cooler confirmed the performance with a maximum temperature difference of 81 K, which is much higher than current commercial Peltier cooling devices.
Additional Information
© 2015 American Association for the Advancement of Science. Received 4 December 2014; accepted 13 February 2015. This work was supported by IBS-R011-D1, the National Research Foundation of Korea (2013R1A1A1008025), the Human Resources Development program (no. 20124010203270) of the Korea Institute of Energy Technology Evaluation and Planning (KETEP) grant funded by the Korea government Ministry of Trade, Industry, and Energy, and AFOSR MURI FA9550-10-1-0533.Attached Files
Supplemental Material - Kim-SM.pdf
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Additional details
- Eprint ID
- 56961
- Resolver ID
- CaltechAUTHORS:20150424-125541234
- Ministry of Science, ICT and Future Planning (Korea)
- IBS-R011-D1
- National Research Foundation of Korea
- 2013R1A1A1008025
- Korea Institute of Energy Technology Evaluation and Planning (KETEP)
- 20124010203270
- Korea Government Ministry of Trade, Industry and Energy (MOTIE)
- Air Force Office of Scientific Research (AFOSR)
- FA9550-10-1-0533
- Created
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2015-04-24Created from EPrint's datestamp field
- Updated
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2021-11-10Created from EPrint's last_modified field