The Effect of Cathode Bias (Field Effect) on the Surface Leakage Current of CdZnTe Detectors
Abstract
Surface resistivity is an important parameter of multi-electrode CZT detectors such as coplanar-grid, strip, or pixel detectors. Low surface resistivity results in a high leakage current and affects the charge collection efficiency in the areas near contacts. Thus, it is always desirable to have the surface resistivity of the detector as high as possible. In the past the most significant efforts were concentrated to develop passivation techniques for CZT detectors. However, as we found, the field-effect caused by a bias applied on the cathode can significantly reduce the surface resistivity even though the detector surface was carefully passivated. In this paper we illustrate that the field-effect is a common feature of the CZT multi-electrode detectors, and discuss how to take advantage of this effect to improve the surface resistivity of CZT detectors.
Additional Information
© 2003 Published by Elsevier Science B.V. Received 18 March 2003; accepted 30 April 2003. This work was supported by NASA under the grant No. NAG5-5289. The authors wish to thank K. Parhnam and C. Szeles from eV-Products, Inc. for fruitful discussions.Additional details
- Eprint ID
- 55953
- Resolver ID
- CaltechAUTHORS:20150320-161137698
- NAG5-5289
- NASA
- Created
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2015-03-24Created from EPrint's datestamp field
- Updated
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2021-11-10Created from EPrint's last_modified field
- Caltech groups
- Space Radiation Laboratory
- Other Numbering System Name
- Space Radiation Laboratory
- Other Numbering System Identifier
- 2003-59