Published 1970
| Submitted
Technical Report
Open
Computer Enhancement of High Resolution Electron Micrographs Containing Weak Periodic Information
- Creators
- Horgen, H. M.
- Villagrana, R. E.
- Maher, D. M.
Chicago
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Abstract
Using image processing methods and Fourier synthesis techniques similar to those mentioned by Nathan (1970), it has been possible to enhance weak periodic information contained in electron micrographs obtained from what might be characterized as less than ideal thin films. This paper describes the results of such an experiment and illustrates the potential afforded by these computer techniques in an ultrastructural analysis of similar type objects.
Additional Information
This investigation was sponsored by the U.S. Atomic Energy Commission and the California Institute of Technology. The authors acknowledge valuable discussions with Dr. R. Nathan, Jet Propulsion Laboratories, California Institute of Technology, Pasadena, California. CALT-767-P3-26.Attached Files
Submitted - Computer_Enhancement_of_High_Resolution_Electron_Micrographs_Containing_Weak_Periodic_Information.pdf
Files
Computer_Enhancement_of_High_Resolution_Electron_Micrographs_Containing_Weak_Periodic_Information.pdf
Files
(1.2 MB)
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Additional details
- Eprint ID
- 55695
- Resolver ID
- CaltechAUTHORS:20150311-081723790
- Atomic Energy Commission
- Caltech
- Created
-
2015-03-11Created from EPrint's datestamp field
- Updated
-
2019-10-03Created from EPrint's last_modified field
- Other Numbering System Name
- CALT
- Other Numbering System Identifier
- 767-P3-26