Published August 1979
| Published
Journal Article
Open
Diffracted beam-transmitted beam Borrmann X-ray topography in copper. A novel method of stereo depth topography
- Creators
- Hamill, G. P.
- Vreeland, T., Jr.
Abstract
The observed depths of dislocations, as measured from the exit surface of a copper single-crystal, are within a region of the crystal where µd, the kinematic linear absorption coefficient times the depth, is less than or approximately equal to unity. Splitting of the Borrmann wave into its diffracted and transmitted beam components is indicated in relatively perfect portions of the crystal near the exit surface.
Additional Information
© 1979 International Union of Crystallography. The research was supported by the National Science Foundation and by a grant from the research office of the Department of the Army. Dr Hamill wishes to express his thanks to the California Institute of Technology for research and teaching assistantships. The work of A. Illig on specimen preparation and photography is gratefully acknowledged.Attached Files
Published - DIFFRACTED_BEAM-TRANSMITTED_BEAM_BORRMANN_X-RAY_TOPOGRAPHY_IN_COPPER.pdf
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DIFFRACTED_BEAM-TRANSMITTED_BEAM_BORRMANN_X-RAY_TOPOGRAPHY_IN_COPPER.pdf
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Additional details
- Eprint ID
- 55528
- Resolver ID
- CaltechAUTHORS:20150305-074514002
- NSF
- Department of the Army
- Created
-
2015-03-05Created from EPrint's datestamp field
- Updated
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2021-11-10Created from EPrint's last_modified field