Scanning Electron Microscopy and X-Ray Microanalysis [Book Review]
- Creators
- Albee, Arden L.
Abstract
This outstanding volume has managed the nearly impossible task of combining the expertise of all six authors in a lucid and homogeneous style of writing. Subtitled 'A Text for Biologists, Material Scientists and Geologists,' the book has evolved from a short course taught each summer at Lehigh University. The book provides a basic knowledge of (1) the electron optics for these instruments a nd their controls, (2) the characteristics of the electron beam-sample interactions, (3) image formation and interpretation, (4) X ray spectrometry and quantitative X ray microanalysis with separate detailed sections on wavelength dispersive and energy dispersive techniques, and (5) specimen preparation, especially for biological materials.
Additional Information
© 1982 American Geophysical Union. Book review of: Scanning Electron Microscopy and X-Ray Microanalysis by J. I. Goldstein, D. E. Newbury, P. Echlin, D. C. Joy, C. Fiori, and E. Lifshin, Plenum, New York, xii + 673 pp., 1981.Attached Files
Published - eost4095.pdf
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Additional details
- Eprint ID
- 52768
- Resolver ID
- CaltechAUTHORS:20141212-131937251
- Created
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2014-12-12Created from EPrint's datestamp field
- Updated
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2021-11-10Created from EPrint's last_modified field
- Caltech groups
- Division of Geological and Planetary Sciences