Published April 1, 1982
| Published
Book Section - Chapter
Open
Electrical and optical measurements on fused quartz under shock compression
- Creators
- Kondo, K.
- Ahrens, T. J.
- Sawaoka, A.
- Others:
- Nellis, W. J.
- Seaman, L.
- Graham, R. A.
Abstract
The resistivities of specimens of SiO_2 (fused quartz) singly and doubly shocked in the 10 to 45 and 27 to 90 GPa range, respectively, demonstrate a marked decrease from values of ∼10Ω⋅m to ∼0.1Ω⋅m at single shock pressure of ∼40 and double shock pressure of ∼74 GPa. The shock‐induced polarizatio profiles also show a sudden change of electrical properties of the material at those pressures. The rapid decrease in resistivity suggests a further transformation to an unknown phase or production of an electron bound level.
Additional Information
© 1982 American Institute of Physics. Published online 01 April 1982.Attached Files
Published - 1.33328.pdf
Files
1.33328.pdf
Files
(303.0 kB)
Name | Size | Download all |
---|---|---|
md5:b95c7ce5e709e5c55972935281d6f0f6
|
303.0 kB | Preview Download |
Additional details
- Eprint ID
- 51102
- Resolver ID
- CaltechAUTHORS:20141031-084124664
- Created
-
2014-10-31Created from EPrint's datestamp field
- Updated
-
2021-11-10Created from EPrint's last_modified field
- Series Name
- AIP Conference Proceedings
- Series Volume or Issue Number
- 78
- Other Numbering System Name
- Caltech Division of Geological and Planetary Sciences
- Other Numbering System Identifier
- 3652