MeV Ion Implantation in Electronic Materials
- Creators
- Tombrello, T. A.
- Other:
- Grabowski, Kenneth S.
Abstract
Using MeV ions for the modification of electronic materials offers a number of advantages: minimizing surface damage; implantation into completed devices – for example, through contacts or photoresist layers; producing controlled radiation damage for flux pinning where the ions pass completely through the sample and thus do not modify its chemical nature; and enhancing the electronic excitation of the target material versus collisional damage, as in adhesion enhancement processes. In all cases, however, one requires a detailed understanding of the new damage mechanisms that occur and how they can be modified in a controlled way by annealing. In this report I shall present examples from a number of our experiments: resistivity and index of refraction modification in semiconductors; adhesion enhancement; mixing of multilayer structures; and modification of the electronic properties of insulators and superconductors.
Additional Information
© 1992 Materials Research Society. Supported in part by the National Science Foundation [Grant DMR90-11230] The work reviewed here has involved the efforts of many people in my group and a large assortment of outside collaborators. Since there are far too many to list here, I direct the reader's attention to the references to the original work that are cited for each example. The funding sources are also as diverse as the coworkers; in addition to the NSF grant listed at the beginning of the article (DMR90-11230], I acknowledge contributions from the NSF's MRG program (DMR88-11795], Lawrence Livermore National Laboratory, Schlumberger-Doll Research, and AT&T Bell Laboratories.Attached Files
Published - 386632.pdf
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Additional details
- Eprint ID
- 50982
- Resolver ID
- CaltechAUTHORS:20141029-083721216
- NSF
- DMR90-11230
- NSF
- DMR88-11795
- Lawrence Livermore National Laboratory
- Schlumberger-Doll Research
- AT&T Bell Laboratories
- Created
-
2014-10-29Created from EPrint's datestamp field
- Updated
-
2021-11-10Created from EPrint's last_modified field
- Series Name
- Materials Research Society Symposia Proceedings
- Series Volume or Issue Number
- 268