Evaluation of Reliability of Brittle Components by Thermal Stress Testing

Abstract

A thermal stressing technique was applied to evaluate two distinct flaw populations (surface and corner) in BaTiO_3 multilayer capacitors. The mechanical reliability of the capacitors was deduced by relating the thermal stress response to the mechanical strength of the material. The surface flaw population alone yields relatively high survival probabilities, whereas incorporation of the corner flaw population severely reduces the probability of survival.

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