Tantalum oxide coatings as candidate environmental barriers
Abstract
Tantalum (Ta) oxide, due to its high-temperature capabilities and thermal expansion coefficient similar to silicon nitride, is a promising candidate for environmental barriers for silicon (Si) nitride-based ceramics. This paper focuses on the development of plasma-sprayed Ta oxide as an environmental barrier coating for silicon nitride. Using a D-optimal design of experiments, plasma-spray processing variables were optimized to maximize coating density. The effect of processing variables on coating thickness was also determined. X-ray diffraction (XRD) was use to ascertain that the as-sprayed coatings were comprised of α- and β-Ta2O5, but were fully converted to β-Ta_2O_5 after a 1200 °C heat treatment. Grain growth of the Ta_2O_5 followed a time dependence of t^(0.2) at 1200 °C.
Additional Information
© 2004 ASM International. (Submitted 17 July 2003; in revised form 17 August 2003). This work was supported by the U.S. Department of Energy under the Energy Efficiency Sciences Program under Cooperative Agreement No. DE-FC020-01CH11086-A000. AS800 samples were provided by C-W. Li and J. Guiheen, also under the above contract.Attached Files
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Additional details
- Eprint ID
- 49382
- Resolver ID
- CaltechAUTHORS:20140908-181321368
- Department of Energy (DOE)
- DE-FC020-01CH11086-A000
- Created
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2014-09-10Created from EPrint's datestamp field
- Updated
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2021-11-10Created from EPrint's last_modified field