Welcome to the new version of CaltechAUTHORS. Login is currently restricted to library staff. If you notice any issues, please email coda@library.caltech.edu
Published November 14, 1983 | Published
Journal Article Open

Critical Scaling of the Conductance in a Disordered Insulator

Abstract

A critical scaling of the real and imaginary parts of the low-frequency ac conductance of insulating phosphorus-doped silicon near the metal-insulator transition has been observed. The results are interpreted as evidence of an electron glass, i.e., glasslike behavior, intimately connected with the scaling description of the transition, in which Coulomb interactions play a significant role.

Additional Information

© 1983 The American Physical Society. (Received 26 August 1983) We would like to thank P. W. Anderson, J. J. Hauser, P. A. Lee, and T. V. Ramakrishnan for helpful discussions.

Attached Files

Published - PhysRevLett.51.1896.pdf

Files

PhysRevLett.51.1896.pdf
Files (254.8 kB)
Name Size Download all
md5:68bfd24002db3231055ad4407a4fcd70
254.8 kB Preview Download

Additional details

Created:
August 19, 2023
Modified:
March 5, 2024